Tuesday, 5 April 2016

TCi Thermal Conductivity Analyzer

TCi Thermal Conductivity Analyzer
The C-Therm TCi Thermal Conductivity Analyzer employs the Modified Transient Plane Source (MTPS) technique in characterizing the thermal conductivity and effusivity of materials. It employs a one-sided, interfacial heat reflectance sensor that applies a momentary constant heat source to the...

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